Optical Techniques for Solid State Materials Characterization

Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 1439814376
Format: PDF, Mobi
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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video

Optical Techniques for Solid State Materials Characterization

Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 9781439815373
Format: PDF, Mobi
Download and Read
Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video

Concise Encyclopedia of Materials Characterization

Author: R.W. Cahn
Publisher: Elsevier
ISBN: 1483287513
Format: PDF, Kindle
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To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.

Optical Characterization of Semiconductors

Author: Sidney Perkowitz
Publisher: Elsevier
ISBN: 0080984274
Format: PDF, ePub, Docs
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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories

Practical Materials Characterization

Author: Mauro Sardela
Publisher: Springer
ISBN: 1461492815
Format: PDF, ePub, Docs
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Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Advanced Characterization Techniques for Thin Film Solar Cells

Author: Daniel Abou-Ras
Publisher: John Wiley & Sons
ISBN: 352769904X
Format: PDF, Mobi
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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

Encyclopedia of Materials Characterization

Author: C. R. Brundle
Publisher: Gulf Professional Publishing
ISBN: 9780750691680
Format: PDF, ePub
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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

Preparation and Characterization of Materials

Author: J Honig
Publisher: Elsevier
ISBN: 0323144357
Format: PDF, ePub, Docs
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Preparation and Characterization of Materials brings together the proceedings of the Indo-U.S. Workshop on the Preparation and Characterization of Materials, held on February 19-23, 1981, at the Indian Institute of Science in Bangalore, India. The papers focus on advances and developments in the preparation and characterization of materials such as ferroics, layered materials, metal oxides and other electronic materials, amorphous materials including glasses, and high-temperature ceramics. This book is comprised of 25 chapters and begins with a discussion on crystal growth and other preparation techniques, touching on topics such as solid state synthesis of complex oxides and preparation of soft ferrites. The application of neutron scattering techniques and analytical electron microscopy to materials research and materials science is then considered, along with the dielectric and electro-optic applications of ferroics and the preparation and characterization of synthetic layered inorganic ion exchangers. Subsequent chapters deal with metal oxides and other electronic materials; glasses and other amorphous materials; and high-temperature ceramics such as silicon nitride. This monograph will be of interest to materials scientists and engineers as well as students and researchers in materials science.

Modern Glass Characterization

Author: Mario Affatigato
Publisher: John Wiley & Sons
ISBN: 1119051878
Format: PDF, Mobi
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The book consists of a series of edited chapters, each written by an expert in the field and focusing on a particular characterization technique as applied to glass. The book covers a variety of techniques ranging from the very common (like Raman and FTIR) to the most recent (and less well known) ones, like SEM for structural analysis and photoelastic measurements. The level of the chapters make it suitable for researchers and for graduate students about to start their research work. It will also: discuss the technique itself, background, nuances when it comes to looking at glassy materials, interpretation of results, case studies, and recent and near-future innovations Fill a widening gap in modern techniques for glass characterization Provide much needed updates on the multiple essential characterization techniques

Graphene and Carbon Nanotubes

Author: Ermin Malic
Publisher: John Wiley & Sons
ISBN: 3527658769
Format: PDF
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A first on ultrafast phenomena in carbon nanostructures like graphene, the most promising candidate for revolutionizing information technology and communication The book introduces the reader into the ultrafast nanoworld of graphene and carbon nanotubes, including their microscopic tracks and unique optical finger prints. The author reviews the recent progress in this field by combining theoretical and experimental achievements. He offers a clear theoretical foundation by presenting transparently derived equations. Recent experimental breakthroughs are reviewed. By combining both theory and experiment as well as main results and detailed theoretical derivations, the book turns into an inevitable source for a wider audience from graduate students to researchers in physics, materials science, and electrical engineering who work on optoelectronic devices, renewable energies, or in the semiconductor industry.